Topic: sample-preparation

Sample preparation techniques for SEM to neutralize the effect of vacuum

By Luigi Raspolini - May 23, 2019

Scanning electron microscopes (SEM) scan the surface of the sample with an electron beam, collecting reflected electrons which carry information about the material the electrons interact with. If gas is in the sample chamber, its atoms interact with the beam, partly deflecting electrons and adding noise to the image. 

This is the reason why vacuum must be achieved in SEM before imaging. But while vacuum is crucial for proper analysis, it can also have a negative effect on certain types of materials. Read this blog to learn how you can neutralize vacuum and keep your samples intact.

Scanning electron microscopes (SEM) scan the surface of the sample with an electron beam, collecting reflected electrons which carry information about the material the electrons interact with. If gas is in the sample chamber, its atoms interact with the beam, partly deflecting electrons and adding noise to the image. 

This is the reason why vacuum must be achieved in SEM before imaging. But while vacuum is crucial for proper analysis, it can also have a negative effect on certain types of materials. Read this blog to learn how you can neutralize vacuum and keep your samples intact.

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Sample tilting in scanning electron microscopy: how to keep the area of interest within the field of view

By Luigi Raspolini - April 18, 2019

Certain samples are tricky to image. Sometimes, even the best sample preparation will be no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

Certain samples are tricky to image. Sometimes, even the best sample preparation will be no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

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Expert sample preparation techniques for SEM

By Luigi Raspolini - April 11, 2019

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

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Microscopic investigation of embedded samples

By Karl Kersten - January 31, 2019

The purpose of embedding is to protect fragile or coated materials during preparation, and to obtain good edge retention. Embedding is also used to produce specimens of a uniform size, such as minerals, clay or other particles and can also be used to section a material and investigate its interior.

The purpose of embedding is to protect fragile or coated materials during preparation, and to obtain good edge retention. Embedding is also used to produce specimens of a uniform size, such as minerals, clay or other particles and can also be used to section a material and investigate its interior.

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Why SEM is a valuable technique for nanoparticle characterization

By Antonis Nanakoudis - January 10, 2019

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

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Imaging fibers with a SEM: how to obtain a flawless quality analysis

By Karl Kersten - December 6, 2018

In our daily life, we make use of a large amount of objects and devices that are produced from fibers. Fibers are usually imaged in a scanning electron microscope (SEM), which provides high-resolution images, elemental analysis, and the possibility of automatically measuring thousands of fibers in mere minutes.

But in some cases, imaging fibers with a SEM also presents challenges, as the nature of some fibers might compromise the quality of your analysis. With this in mind, this blog describes how you can obtain a high analysis quality through proper SEM configuration and sample preparation. 

In our daily life, we make use of a large amount of objects and devices that are produced from fibers. Fibers are usually imaged in a scanning electron microscope (SEM), which provides high-resolution images, elemental analysis, and the possibility of automatically measuring thousands of fibers in mere minutes.

But in some cases, imaging fibers with a SEM also presents challenges, as the nature of some fibers might compromise the quality of your analysis. With this in mind, this blog describes how you can obtain a high analysis quality through proper SEM configuration and sample preparation. 

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Sample preparation: how to disperse powder for amazing SEM images

By Willem van Zyl - November 16, 2018

The ability to analyze particles is becoming increasingly more important due to the rising prominence of additive manufacturing, leading to more stringent quality requirements for industrial manufacturers. Beyond maximizing yields, manufacturers need to ensure that their processes consistently deliver particles that have the appropriate size and morphology.

The ability to analyze particles is becoming increasingly more important due to the rising prominence of additive manufacturing, leading to more stringent quality requirements for industrial manufacturers. Beyond maximizing yields, manufacturers need to ensure that their processes consistently deliver particles that have the appropriate size and morphology.

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How sample preparation for SEM helps lab operators produce images faster

By Karl Kersten - November 1, 2018

As a seasoned lab operator, you work with microscopes for the majority of the day, and are very specialized in sample preparation and handling the SEM system. And it’s a responsible job: your output leads to the overall improvement of your company’s products and company results. Therefore, the quality of your work must be outstanding. But at the same time, you want to deliver output quickly. 

As a seasoned lab operator, you work with microscopes for the majority of the day, and are very specialized in sample preparation and handling the SEM system. And it’s a responsible job: your output leads to the overall improvement of your company’s products and company results. Therefore, the quality of your work must be outstanding. But at the same time, you want to deliver output quickly. 

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Why do your materials break? Tensile testing: inspecting the breaking mechanisms of materials with SEM

By Luigi Raspolini - September 27, 2018

Tensile testing is a commonly-used analysis that provides information on the resilience of an object and how much resistance it can offer to traction or compression. Such tests can be performed on a large variety of materials and provide useful information to speculate on the behavior of a material when it undergoes a stress. The main purpose of the tensile test is to evaluate relevant parameters (like the Young's modulus, for example) or to study the how shear stress affects the material. This allows researchers to create models and design better materials. But how can you see what is happening? A scanning electron microscope (SEM) with tensile testing capabilities can provide you with that information.

Tensile testing is a commonly-used analysis that provides information on the resilience of an object and how much resistance it can offer to traction or compression. Such tests can be performed on a large variety of materials and provide useful information to speculate on the behavior of a material when it undergoes a stress. The main purpose of the tensile test is to evaluate relevant parameters (like the Young's modulus, for example) or to study the how shear stress affects the material. This allows researchers to create models and design better materials. But how can you see what is happening? A scanning electron microscope (SEM) with tensile testing capabilities can provide you with that information.

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Sputter coating for SEM: how this sample preparation technique assists your imaging

By Antonis Nanakoudis - August 9, 2018

Scanning electron microscopes (SEMs) are very versatile tools that can provide information at the nanoscale of many different samples - with little or no sample preparation. In some cases though, sputter coating the samples prior to working with SEMs is recommended, or even necessary, in order to get a good SEM image. In this blog, we will explain how the sputter coating process works, and to which type of samples it should be applied.

Scanning electron microscopes (SEMs) are very versatile tools that can provide information at the nanoscale of many different samples - with little or no sample preparation. In some cases though, sputter coating the samples prior to working with SEMs is recommended, or even necessary, in order to get a good SEM image. In this blog, we will explain how the sputter coating process works, and to which type of samples it should be applied.

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