Blog

Sample tilting in scanning electron microscopy: how to keep the area of interest within the field of view

By Luigi Raspolini - April 18, 2019

Certain samples are tricky to image. Sometimes, even the best sample preparation will be no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

Certain samples are tricky to image. Sometimes, even the best sample preparation will be no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

Read more

Expert sample preparation techniques for SEM

By Luigi Raspolini - April 11, 2019

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

Read more

Desktop SEM electron sources: why CeB6 is the right choice

By Karl Kersten - April 4, 2019

If you’re looking for a scanning electron microscope (SEM), you probably know by now that the electron source is one of the most important parts of the system. In a previous blog, we talked about the properties of three different electron sources: the Tungsten, CeB6 and FEG sourcesIn this blog, we’ll take a closer look at Tungsten and CeB6 electron sources.

If you’re looking for a scanning electron microscope (SEM), you probably know by now that the electron source is one of the most important parts of the system. In a previous blog, we talked about the properties of three different electron sources: the Tungsten, CeB6 and FEG sourcesIn this blog, we’ll take a closer look at Tungsten and CeB6 electron sources.

Read more

FEG vs. Tungsten source in a scanning electron microscope (SEM): what’s the difference?

By Kay Mam - March 28, 2019

After few years of operating a transmission electron microscope (TEM) in my postgraduate studies, in 2006 I started my career in electron microscopy as an SEM operator for a biological and medical research center in York (United Kingdom). Not knowing how to operate an SEM before, I found it relatively easy to switch from TEM to SEM.

After few years of operating a transmission electron microscope (TEM) in my postgraduate studies, in 2006 I started my career in electron microscopy as an SEM operator for a biological and medical research center in York (United Kingdom). Not knowing how to operate an SEM before, I found it relatively easy to switch from TEM to SEM.

Read more
Topics: FEG

How a microfabrication researcher uses SEM as a technique to verify nanoscale structures

By Jake Wilkinson - March 21, 2019

Microfabrication, the creation of microscale structures and features, is an essential technique for the creation of next-generation semiconductors, processors and the ‘lab-on-a-chip’ microfluidic systems found in chemical analysis systems that can fit in the palm of your hand. 

Microfabrication, the creation of microscale structures and features, is an essential technique for the creation of next-generation semiconductors, processors and the ‘lab-on-a-chip’ microfluidic systems found in chemical analysis systems that can fit in the palm of your hand. 

Read more

How scanning electron microscopy impacts dental studies

By Karl Kersten - March 13, 2019

Microscopy is known to be a versatile tool in dental studies. Not only is optical microscopy used in day-to-day practices in dental clinics, but due to the surface information electron microscopy offers, it is used within a large variety of research subjects. With the following examples we want to offer more insights into how in detail scanning electron microscopy (SEM) is utilized within various dental studies.

Microscopy is known to be a versatile tool in dental studies. Not only is optical microscopy used in day-to-day practices in dental clinics, but due to the surface information electron microscopy offers, it is used within a large variety of research subjects. With the following examples we want to offer more insights into how in detail scanning electron microscopy (SEM) is utilized within various dental studies.

Read more
Topics: Life Sciences

How next-generation composite materials are manufactured and analysed

By Luigi Raspolini - March 7, 2019

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

Read more

How to spot astigmatism in Scanning Electron Microscopy (SEM) images

By Willem van Zyl - February 28, 2019

You may have heard of astigmatism as a medical condition that causes visual impairment in up to 40% of adults [1], but how is this applicable to electron microscopy? First of all, let’s talk about what the word astigmatism, in fact, means: It is derived from the negative prefix ‘a’ (without) + ‘stigmat-’ (mark, or point, in Ancient Greek) + ‘ism’ (condition). In a perfect optical system, a lens has only one focal point, and is stigmatic. When the lens has more than one focal point, however, we refer to the lens as being astigmatic. This happens when the lens is elongated in either the sagittal (y-axis) or tangential (x-axis) plane, resulting in two focal points (= foci).

You may have heard of astigmatism as a medical condition that causes visual impairment in up to 40% of adults [1], but how is this applicable to electron microscopy? First of all, let’s talk about what the word astigmatism, in fact, means: It is derived from the negative prefix ‘a’ (without) + ‘stigmat-’ (mark, or point, in Ancient Greek) + ‘ism’ (condition). In a perfect optical system, a lens has only one focal point, and is stigmatic. When the lens has more than one focal point, however, we refer to the lens as being astigmatic. This happens when the lens is elongated in either the sagittal (y-axis) or tangential (x-axis) plane, resulting in two focal points (= foci).

Read more

SEM: types of electrons, their detection and the information they provide

By Antonis Nanakoudis - February 21, 2019

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide.

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide.

Read more

SEM automation – the future of scanning electron microscopy

By Rose Helweg - February 14, 2019

Kai van Beek, Director of Market Development at Thermo Fisher Scientific™, analyzes the market and how the company's products fit customers' current and future needs. Together with his team, he defines the roadmap for product development. For almost 20 years, he has been working with automated scanning electron microscopy (SEM) solutions. In this interview, Kai looks back over many years of SEM experience and talks about current and future automated SEM products, the demands of the market and his personal vision regarding the automation of SEM.

Kai van Beek, Director of Market Development at Thermo Fisher Scientific™, analyzes the market and how the company's products fit customers' current and future needs. Together with his team, he defines the roadmap for product development. For almost 20 years, he has been working with automated scanning electron microscopy (SEM) solutions. In this interview, Kai looks back over many years of SEM experience and talks about current and future automated SEM products, the demands of the market and his personal vision regarding the automation of SEM.

Read more

Press Room | Privacy Policy | Terms of Use | Sitemap |