Topic: TILTING

SEM sample tilting: how to keep the area of interest within the field of view

By Luigi Raspolini - Aug 10, 2017

Certain samples are tricky to image. Sometimes, even the best sample preparation will be of no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

Certain samples are tricky to image. Sometimes, even the best sample preparation will be of no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

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Topics: SEM, tilting

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