Topic: scanning-electron-microscope

Everything is nano these days: to improve the world of nanotechnology we make extremely fast SEM imaging and analysis accessible to everyone

By Karl Kersten - Dec 20, 2018

Imaging with a Scanning Electron Microscope (SEM) is a powerful tool for any materials scientist, though historically, accessing the technique was an issue. SEM involved using large, expensive systems that were only available to large research institutions. Even then, access was often difficult, due to long waiting lists and because their complex operation required in-depth training.

Imaging with a Scanning Electron Microscope (SEM) is a powerful tool for any materials scientist, though historically, accessing the technique was an issue. SEM involved using large, expensive systems that were only available to large research institutions. Even then, access was often difficult, due to long waiting lists and because their complex operation required in-depth training.

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Phenom Pharos Desktop SEM wins Analytical Scientist Innovation Award 2018!

By Rose Helweg - Dec 19, 2018

The Thermo Scientific™ Phenom Pharos Desktop SEM has been voted second place in the Analytical Scientist Innovation Awards 2018! The microscope—which was introduced in August 2018—is the flagship of the Phenom Desktop SEM product range.

The Thermo Scientific™ Phenom Pharos Desktop SEM has been voted second place in the Analytical Scientist Innovation Awards 2018! The microscope—which was introduced in August 2018—is the flagship of the Phenom Desktop SEM product range.

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FEG source: what you need to know

By Karl Kersten - Nov 26, 2018

Until very recently, we have not seen a high kilovolt (kV) imaging desktop scanning electron microscope (SEM) with a Field Emission Gun (FEG) source in it. Why not? And why can it be useful to have a FEG source in a desktop SEM? This article provides some answers.

Until very recently, we have not seen a high kilovolt (kV) imaging desktop scanning electron microscope (SEM) with a Field Emission Gun (FEG) source in it. Why not? And why can it be useful to have a FEG source in a desktop SEM? This article provides some answers.

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Backscattered electron imaging explained

By Karl Kersten - Oct 4, 2018

 Backscattered electrons (BSEs) are generated by elastic scattering events. When the electrons in the primary beam travel close to the atom’s nuclei in the specimen, their trajectory is deviated due to the force they feel with the positive charges in the nuclei. Depending on the size of the atom nuclei, the number of backscattered electrons differs. This is the basic principle of BSE image contrast. In this blog we introduce the backscattering coefficient and explain how it is influenced by the inclination of the sample and the primary beam energy.

 Backscattered electrons (BSEs) are generated by elastic scattering events. When the electrons in the primary beam travel close to the atom’s nuclei in the specimen, their trajectory is deviated due to the force they feel with the positive charges in the nuclei. Depending on the size of the atom nuclei, the number of backscattered electrons differs. This is the basic principle of BSE image contrast. In this blog we introduce the backscattering coefficient and explain how it is influenced by the inclination of the sample and the primary beam energy.

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Backscattered electron images: how to improve their quality

By Karl Kersten - Sep 21, 2018

Backscatter electrons (BSEs) carry information on the material of the sample. Obtaining high-quality images with a backscattered electron detector depends on many factors, such as the conductivity of the sample, its morphology and composition, the type of BSE detector and the electronics. Given a fixed system with the same detector and electronics— and the same sample, we analyzed the factors that play a role in the quality of a BSE image. Beginning with the number of integrating frames and beam intensity, in this blog we will also discuss the roles of the working distance and the chamber pressure.

Backscatter electrons (BSEs) carry information on the material of the sample. Obtaining high-quality images with a backscattered electron detector depends on many factors, such as the conductivity of the sample, its morphology and composition, the type of BSE detector and the electronics. Given a fixed system with the same detector and electronics— and the same sample, we analyzed the factors that play a role in the quality of a BSE image. Beginning with the number of integrating frames and beam intensity, in this blog we will also discuss the roles of the working distance and the chamber pressure.

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Tungsten vs. CeB6 electron source: Choosing the right desktop SEM

By Wouter - Sep 13, 2018

Considering a desktop scanning electron microscope (SEM)? If so, then it is important to determine what type of electron source fits your needs, since it has a direct effect on the quality of your output. In this blog, we'll therefore describe compare a Tungsten electron source with a CeB6 electron source. Read on to learn to discover which electron source is most suitable for a desktop SEM.

Considering a desktop scanning electron microscope (SEM)? If so, then it is important to determine what type of electron source fits your needs, since it has a direct effect on the quality of your output. In this blog, we'll therefore describe compare a Tungsten electron source with a CeB6 electron source. Read on to learn to discover which electron source is most suitable for a desktop SEM.

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STOP outsourcing your scanning electron microscopy research — get your own SEM!

By Karl Kersten - Sep 6, 2018

Are you a lab operator who wants to stop outsourcing your scanning electron microscopy jobs and buy your own Scanning Electron Microscope? Then you’ve probably already calculated that a personal SEM is a worthwhile capital investment. But the operational costs of SEM are just as important too: all the ongoing equipment expenses related to an SEM like the facilities, its maintenance, and operators.

Are you a lab operator who wants to stop outsourcing your scanning electron microscopy jobs and buy your own Scanning Electron Microscope? Then you’ve probably already calculated that a personal SEM is a worthwhile capital investment. But the operational costs of SEM are just as important too: all the ongoing equipment expenses related to an SEM like the facilities, its maintenance, and operators.

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Buying a scanning electron microscope: how to select the right SEM

By Karl Kersten - Aug 2, 2018

You want to buy a new scanning electron microscope (SEM) because you know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long.

You’ve made your case that your company could significantly improve their business performance and you could do your job better if SEM imaging and analysis were easier, faster and more accessible. Can a desktop SEM do what you need? This article provides the answers and helps you to select the right SEM.

You want to buy a new scanning electron microscope (SEM) because you know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long.

You’ve made your case that your company could significantly improve their business performance and you could do your job better if SEM imaging and analysis were easier, faster and more accessible. Can a desktop SEM do what you need? This article provides the answers and helps you to select the right SEM.

Read more

EDX analysis with a scanning electron microscope (SEM): how does it work?

By Antonis Nanakoudis - Jun 21, 2018

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction, and these can provide additional information about the sample. In this blog we will describe how energy-dispersive X-ray (EDX or EDS) analysis works on a SEM.

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction, and these can provide additional information about the sample. In this blog we will describe how energy-dispersive X-ray (EDX or EDS) analysis works on a SEM.

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What is SEM? Scanning electron microscope technology explained

By Antonis Nanakoudis - Jun 7, 2018

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we explain what SEM is and describe the main working principles of a SEM instrument.

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we explain what SEM is and describe the main working principles of a SEM instrument.

Read more

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