Topic: EDX-EDS-ANALYSIS

Additive manufacturing: improving the quality of AM processes through SEM analysis

By Antonis Nanakoudis - May 17, 2018

In a previous blog, we introduced Additive Manufacturing (AM) as a new manufacturing approach and described its key points (you can read the blog here). Additive Manufacturing, also known as 3D printing or rapid prototyping, has attracted the attention of many people and industries around the world due to its unlimited and promising potential. In this blog we will describe how the use of a Scanning Electron Microscope (SEM) can be a powerful tool to monitor and improve the quality of additive manufacturingprocesses.

In a previous blog, we introduced Additive Manufacturing (AM) as a new manufacturing approach and described its key points (you can read the blog here). Additive Manufacturing, also known as 3D printing or rapid prototyping, has attracted the attention of many people and industries around the world due to its unlimited and promising potential. In this blog we will describe how the use of a Scanning Electron Microscope (SEM) can be a powerful tool to monitor and improve the quality of additive manufacturingprocesses.

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SEM & EDS: contamination detection and chemical composition analysis equipment

By Luigi Raspolini - Jan 12, 2018

Imperfections and small malfunctions in machines can sometimes cause contamination of the final products that roll off the production line. Metal particles can detach from the moving part of machines because of usage and friction and deposit on the product, sometimes compromising its quality irreversibly. This blog describes a technique that not only allows you to inspect for the presence of contamination, but also to identify its origination.

Imperfections and small malfunctions in machines can sometimes cause contamination of the final products that roll off the production line. Metal particles can detach from the moving part of machines because of usage and friction and deposit on the product, sometimes compromising its quality irreversibly. This blog describes a technique that not only allows you to inspect for the presence of contamination, but also to identify its origination.

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How to prevent oxidative damage to a scanning electron microscope sample

By Luigi Raspolini - Dec 7, 2017

O2 is an extremely reactive gas, and some materials don’t get along well with it. Oxidation processes are activated as soon as certain samples are exposed to the atmosphere and this affects the structure and characteristics of the samples — in most cases permanently. This blog explains how such effects can be prevented and how SEM analysis can be performed on oxygen-sensitive samples without compromising the structure of the sample itself.

O2 is an extremely reactive gas, and some materials don’t get along well with it. Oxidation processes are activated as soon as certain samples are exposed to the atmosphere and this affects the structure and characteristics of the samples — in most cases permanently. This blog explains how such effects can be prevented and how SEM analysis can be performed on oxygen-sensitive samples without compromising the structure of the sample itself.

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The role of the electron beam voltage in scanning electron microscopy

By Luigi Raspolini - Nov 23, 2017

When conducting electron microscopy (EM) analysis, there are a few important parameters that must be taken into account to produce the best possible results, and to image the feature of interest. One of the crucial roles is played by the voltage (or tension) applied to the source electrodes to generate the electron beam. Historically, the trend has always been to increase the voltage to improve the resolution of the system.

It is only in recent years that scanning electron microscope (SEM) producers have started to focus on improving the resolution at lower voltages. A major role in this has been the expanding field of application of EM to the life sciences - especially after the introduction of the Nobel prize-winning cryo-SEM technique. This blog will focus on the effects of the voltage on the results of the analysis.

When conducting electron microscopy (EM) analysis, there are a few important parameters that must be taken into account to produce the best possible results, and to image the feature of interest. One of the crucial roles is played by the voltage (or tension) applied to the source electrodes to generate the electron beam. Historically, the trend has always been to increase the voltage to improve the resolution of the system.

It is only in recent years that scanning electron microscope (SEM) producers have started to focus on improving the resolution at lower voltages. A major role in this has been the expanding field of application of EM to the life sciences - especially after the introduction of the Nobel prize-winning cryo-SEM technique. This blog will focus on the effects of the voltage on the results of the analysis.

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How EDX analysis with a scanning electron microscope (SEM) works

By Antonis Nanakoudis - Sep 7, 2017

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction — these can provide additional information about the sample. In this blog we will describe how energy — dispersive — X-ray (EDX or EDS) analysis works on a SEM.

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction — these can provide additional information about the sample. In this blog we will describe how energy — dispersive — X-ray (EDX or EDS) analysis works on a SEM.

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How next-generation composite materials are created and analysed

By Luigi Raspolini - Jul 6, 2017

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

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How SEM helps discover suitable corrosion inhibitors

By Dr. Jasmin Zahn - Jun 12, 2017

Many industries would benefit from the inhibition of corrosion in metals. In the materials science field, scientists are therefore exploring ways to prevent or reduce corrosion. Many studies looking for suitable corrosion inhibitors have been carried out.

However, most of the inhibitors discovered and developed during those studies were synthetic chemicals, which are very expensive, and hazardous to the environment. Due to the characteristics of these chemicals, studies were carried out to investigate and analyze natural products that could be used as an anti-corrosion agent. SEM technology helped conduct these studies in an effective manner, something we will describe further in this article.

Many industries would benefit from the inhibition of corrosion in metals. In the materials science field, scientists are therefore exploring ways to prevent or reduce corrosion. Many studies looking for suitable corrosion inhibitors have been carried out.

However, most of the inhibitors discovered and developed during those studies were synthetic chemicals, which are very expensive, and hazardous to the environment. Due to the characteristics of these chemicals, studies were carried out to investigate and analyze natural products that could be used as an anti-corrosion agent. SEM technology helped conduct these studies in an effective manner, something we will describe further in this article.

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What is SEM? SEM technology explained

By Antonis Nanakoudis - Jun 1, 2017

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we describe the main working principles of a SEM instrument.

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we describe the main working principles of a SEM instrument.

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X-ray analysis on the spot? Use desktop SEM with EDS

By Jeroen Smulders - Aug 4, 2016

You probably want to use Energy Dispersive X-­Ray Spectroscopy — or X-­ray/EDS analysis — to determine the elemental composition of a sample. Is it hard for you to get your analysis done proper and fast? And is it even harder to gather quantitative compositional information of your sample quickly?

You probably want to use Energy Dispersive X-­Ray Spectroscopy — or X-­ray/EDS analysis — to determine the elemental composition of a sample. Is it hard for you to get your analysis done proper and fast? And is it even harder to gather quantitative compositional information of your sample quickly?

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