Luigi Raspolini

Luigi Raspolini is an Application Engineer at Thermo Fisher Scientific, the world leader in serving science. Luigi is constantly looking for new approaches to materials characterization, surface roughness measurements and composition analysis. He is passionate about improving user experiences and demonstrating the best way to image every kind of sample.

Using a SEM in packaging material development and analysis

By Luigi Raspolini - Oct 25, 2018

Nowadays, the packaging industry is one of the fastest growing in terms of technology advancement and employing the latest available scientific developments. The reason lies in the greater demand for products and the upscale of shipments from regional transport to worldwide delivery. To ensure that the technologies are integrated in the right way, and to verify the quality of such introductions, more advanced inspection tools are required and scanning electron microscopes (SEM) play an increasingly important role in the material development. This blog will highlight some of the most common uses of electron microscopy within this field of application.

Nowadays, the packaging industry is one of the fastest growing in terms of technology advancement and employing the latest available scientific developments. The reason lies in the greater demand for products and the upscale of shipments from regional transport to worldwide delivery. To ensure that the technologies are integrated in the right way, and to verify the quality of such introductions, more advanced inspection tools are required and scanning electron microscopes (SEM) play an increasingly important role in the material development. This blog will highlight some of the most common uses of electron microscopy within this field of application.

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Topics: R&D

Why do your materials break? Tensile testing: inspecting the breaking mechanisms of materials with SEM

By Luigi Raspolini - Sep 27, 2018

Tensile testing is a commonly-used analysis that provides information on the resilience of an object and how much resistance it can offer to traction or compression. Such tests can be performed on a large variety of materials and provide useful information to speculate on the behavior of a material when it undergoes a stress. The main purpose of the tensile test is to evaluate relevant parameters (like the Young's modulus, for example) or to study the how shear stress affects the material. This allows researchers to create models and design better materials. But how can you see what is happening? A scanning electron microscope (SEM) with tensile testing capabilities can provide you with that information.

Tensile testing is a commonly-used analysis that provides information on the resilience of an object and how much resistance it can offer to traction or compression. Such tests can be performed on a large variety of materials and provide useful information to speculate on the behavior of a material when it undergoes a stress. The main purpose of the tensile test is to evaluate relevant parameters (like the Young's modulus, for example) or to study the how shear stress affects the material. This allows researchers to create models and design better materials. But how can you see what is happening? A scanning electron microscope (SEM) with tensile testing capabilities can provide you with that information.

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SEM technology: the role of the electron beam voltage in electron microscopy analysis

By Luigi Raspolini - Jul 6, 2018

When conducting electron microscopy (EM) analysis, there are a few important parameters that must be taken into account to produce the best possible results, and to image the feature of interest. One of the crucial roles is played by the voltage (or tension) applied to the source electrodes to generate the electron beam. Historically, the trend has always been to increase the voltage to improve the resolution of the system.

It is only in recent years that scanning electron microscope (SEM) producers have started to focus on improving the resolution at lower voltages. A major role in this has been the expanding field of application of EM to the life sciences - especially after the introduction of the Nobel prize-winning cryo-SEM technique. This blog will focus on the effects of the voltage on the results of electron microscopy analysis.


When conducting electron microscopy (EM) analysis, there are a few important parameters that must be taken into account to produce the best possible results, and to image the feature of interest. One of the crucial roles is played by the voltage (or tension) applied to the source electrodes to generate the electron beam. Historically, the trend has always been to increase the voltage to improve the resolution of the system.

It is only in recent years that scanning electron microscope (SEM) producers have started to focus on improving the resolution at lower voltages. A major role in this has been the expanding field of application of EM to the life sciences - especially after the introduction of the Nobel prize-winning cryo-SEM technique. This blog will focus on the effects of the voltage on the results of electron microscopy analysis.


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Battery research with a SEM: inspecting one layer at a time

By Luigi Raspolini - May 31, 2018

Batteries revolutionized the world of electronics by enabling us to carry an energy reserve in our pockets. Miniaturization and efficiency are the two key words when it comes to new developments in this field, impacting with the battery materials’ properties and stretching their limits. Let’s take a look at how researchers characterize materials and gather relevant information about batteries using scanning electron microscopy (SEM).

Batteries revolutionized the world of electronics by enabling us to carry an energy reserve in our pockets. Miniaturization and efficiency are the two key words when it comes to new developments in this field, impacting with the battery materials’ properties and stretching their limits. Let’s take a look at how researchers characterize materials and gather relevant information about batteries using scanning electron microscopy (SEM).

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Effective asbestos detection with a Scanning Electron Microscope (SEM)

By Luigi Raspolini - May 10, 2018

Resistance to fire, sound absorption, tensile strength and low price caused a boost in asbestos mining activities at the beginning of 19th century.

Already used in the production of asphalt, brake pads, electrical insulators, fireproof suits, technical fabrics and other everyday products, asbestos started its golden century when the Austrian engineer Ludwig Hatschek invented the first asbestos-cement, often mistakenly referred to as Eternit.

The material properties, particularly its lightness and resilience, started a real revolution in the construction engineering and asbestos-cements factories, which immediately emerged all over the world.

Resistance to fire, sound absorption, tensile strength and low price caused a boost in asbestos mining activities at the beginning of 19th century.

Already used in the production of asphalt, brake pads, electrical insulators, fireproof suits, technical fabrics and other everyday products, asbestos started its golden century when the Austrian engineer Ludwig Hatschek invented the first asbestos-cement, often mistakenly referred to as Eternit.

The material properties, particularly its lightness and resilience, started a real revolution in the construction engineering and asbestos-cements factories, which immediately emerged all over the world.

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What is depth of field and how can I optimize it in a scanning electron microscope?

By Luigi Raspolini - May 3, 2018

Imaging with a scanning electron microscope (SEM) consists of taking pictures of small features. So why not consider a comparison with photography? Let’s analyze how similar the behaviors of a SEM and a camera are when it comes to focusing on your subject, and what the exact definition of depth of field is.

Tip: Get a free demo of our Desktop SEM and discover it's capabilities for your research
Request your personal demo

Imaging with a scanning electron microscope (SEM) consists of taking pictures of small features. So why not consider a comparison with photography? Let’s analyze how similar the behaviors of a SEM and a camera are when it comes to focusing on your subject, and what the exact definition of depth of field is.

Tip: Get a free demo of our Desktop SEM and discover it's capabilities for your research
Request your personal demo

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How SEM helps research polymers characteristics, properties, and uses

By Luigi Raspolini - Apr 19, 2018

Polymers have many uses and applications: engineered combinations of monomers produce a nearly infinite number of molecules with different properties, which are determined by the chemical composition and structure of the molecule. The form of the molecule has a big influence on how the polymer will behave when exposed to different external forces. In this blog, you’ll find practical examples of how Scanning Electron Microscopes (SEMs) can provide unexpected results.

Polymers have many uses and applications: engineered combinations of monomers produce a nearly infinite number of molecules with different properties, which are determined by the chemical composition and structure of the molecule. The form of the molecule has a big influence on how the polymer will behave when exposed to different external forces. In this blog, you’ll find practical examples of how Scanning Electron Microscopes (SEMs) can provide unexpected results.

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SEM and fiber analysis for filtration systems quality control

By Luigi Raspolini - Feb 16, 2018

The production of filters and membranes undergoes several quality control steps to ensure that the properties of the product are up to specification. Different tools can be used for such analysis, but only one can provide the best results. Find out in this blog how Scanning Electron Microscopes (SEM) can be used to investigate imperfections in metallic filters.

The production of filters and membranes undergoes several quality control steps to ensure that the properties of the product are up to specification. Different tools can be used for such analysis, but only one can provide the best results. Find out in this blog how Scanning Electron Microscopes (SEM) can be used to investigate imperfections in metallic filters.

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SEM & EDS: contamination detection and chemical composition analysis equipment

By Luigi Raspolini - Jan 12, 2018

Imperfections and small malfunctions in machines can sometimes cause contamination of the final products that roll off the production line. Metal particles can detach from the moving part of machines because of usage and friction and deposit on the product, sometimes compromising its quality irreversibly. This blog describes a technique that not only allows you to inspect for the presence of contamination, but also to identify its origination.

Imperfections and small malfunctions in machines can sometimes cause contamination of the final products that roll off the production line. Metal particles can detach from the moving part of machines because of usage and friction and deposit on the product, sometimes compromising its quality irreversibly. This blog describes a technique that not only allows you to inspect for the presence of contamination, but also to identify its origination.

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How to prevent oxidative damage to a scanning electron microscope sample

By Luigi Raspolini - Dec 7, 2017

O2 is an extremely reactive gas, and some materials don’t get along well with it. Oxidation processes are activated as soon as certain samples are exposed to the atmosphere and this affects the structure and characteristics of the samples — in most cases permanently. This blog explains how such effects can be prevented and how SEM analysis can be performed on oxygen-sensitive samples without compromising the structure of the sample itself.

O2 is an extremely reactive gas, and some materials don’t get along well with it. Oxidation processes are activated as soon as certain samples are exposed to the atmosphere and this affects the structure and characteristics of the samples — in most cases permanently. This blog explains how such effects can be prevented and how SEM analysis can be performed on oxygen-sensitive samples without compromising the structure of the sample itself.

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