Luigi Raspolini

Luigi Raspolini is an Application Engineer at Phenom-World, the world’s no 1 supplier of desktop scanning electron microscopes. Luigi is constantly looking for new approaches to materials characterization, surface roughness measurements and composition analysis. He is passionate about improving user experiences and demonstrating the best way to image every kind of sample.

SEM and fiber analysis for filtration systems quality control

By Luigi Raspolini - Feb 16, 2018

The production of filters and membranes undergoes several quality control steps to ensure that the properties of the product are up to specification. Different tools can be used for such analysis, but only one can provide the best results. Find out in this blog how Scanning Electron Microscopes (SEM) can be used to investigate imperfections in metallic filters.

The production of filters and membranes undergoes several quality control steps to ensure that the properties of the product are up to specification. Different tools can be used for such analysis, but only one can provide the best results. Find out in this blog how Scanning Electron Microscopes (SEM) can be used to investigate imperfections in metallic filters.

Read more

SEM & EDS: contamination detection and chemical composition analysis equipment

By Luigi Raspolini - Jan 12, 2018

Imperfections and small malfunctions in machines can sometimes cause contamination of the final products that roll off the production line. Metal particles can detach from the moving part of machines because of usage and friction and deposit on the product, sometimes compromising its quality irreversibly. This blog describes a technique that not only allows you to inspect for the presence of contamination, but also to identify its origination.

Imperfections and small malfunctions in machines can sometimes cause contamination of the final products that roll off the production line. Metal particles can detach from the moving part of machines because of usage and friction and deposit on the product, sometimes compromising its quality irreversibly. This blog describes a technique that not only allows you to inspect for the presence of contamination, but also to identify its origination.

Read more
Topics: EDX

How to prevent oxidative damage to a scanning electron microscope sample

By Luigi Raspolini - Dec 7, 2017

O2 is an extremely reactive gas, and some materials don’t get along well with it. Oxidation processes are activated as soon as certain samples are exposed to the atmosphere and this affects the structure and characteristics of the samples — in most cases permanently. This blog explains how such effects can be prevented and how SEM analysis can be performed on oxygen-sensitive samples without compromising the structure of the sample itself.

O2 is an extremely reactive gas, and some materials don’t get along well with it. Oxidation processes are activated as soon as certain samples are exposed to the atmosphere and this affects the structure and characteristics of the samples — in most cases permanently. This blog explains how such effects can be prevented and how SEM analysis can be performed on oxygen-sensitive samples without compromising the structure of the sample itself.

Read more

The role of the electron beam voltage in scanning electron microscopy

By Luigi Raspolini - Nov 23, 2017

When conducting electron microscopy (EM) analysis, there are a few important parameters that must be taken into account to produce the best possible results, and to image the feature of interest. One of the crucial roles is played by the voltage (or tension) applied to the source electrodes to generate the electron beam. Historically, the trend has always been to increase the voltage to improve the resolution of the system.

It is only in recent years that scanning electron microscope (SEM) producers have started to focus on improving the resolution at lower voltages. A major role in this has been the expanding field of application of EM to the life sciences - especially after the introduction of the Nobel prize-winning cryo-SEM technique. This blog will focus on the effects of the voltage on the results of the analysis.

When conducting electron microscopy (EM) analysis, there are a few important parameters that must be taken into account to produce the best possible results, and to image the feature of interest. One of the crucial roles is played by the voltage (or tension) applied to the source electrodes to generate the electron beam. Historically, the trend has always been to increase the voltage to improve the resolution of the system.

It is only in recent years that scanning electron microscope (SEM) producers have started to focus on improving the resolution at lower voltages. A major role in this has been the expanding field of application of EM to the life sciences - especially after the introduction of the Nobel prize-winning cryo-SEM technique. This blog will focus on the effects of the voltage on the results of the analysis.

Read more

How electron microscopy fuels the development of eco-friendly polymers

By Luigi Raspolini - Oct 12, 2017

Thermosetting polymers are widely used in modern industry due to their specific chemical and physical properties. With a wide range of applications, from components of huge aircraft to small electronics, epoxies are one of the main products of the polymers industry. This blog will focus on how these materials are improved and made eco-friendly, by making use of a scanning electron microscope (SEM).

Thermosetting polymers are widely used in modern industry due to their specific chemical and physical properties. With a wide range of applications, from components of huge aircraft to small electronics, epoxies are one of the main products of the polymers industry. This blog will focus on how these materials are improved and made eco-friendly, by making use of a scanning electron microscope (SEM).

Read more

Why hi-tech textile engineering requires SEM analysis

By Luigi Raspolini - Sep 28, 2017

It’s been a long time since the textile industry relied exclusively on natural fibers. Over the decades, synthetic fibers have proven to be cheaper, easier to produce and often perform better. At the same time, chemical treatments have been developed that improve the smoothness and the resistance of both natural and synthetic fibers, which has resulted in higher quality products. Read this blog for more information on how electron microscopy can play a fundamental role in this development process.

It’s been a long time since the textile industry relied exclusively on natural fibers. Over the decades, synthetic fibers have proven to be cheaper, easier to produce and often perform better. At the same time, chemical treatments have been developed that improve the smoothness and the resistance of both natural and synthetic fibers, which has resulted in higher quality products. Read this blog for more information on how electron microscopy can play a fundamental role in this development process.

Read more

Sample preparation techniques for SEM to neutralize the effect of vacuum

By Luigi Raspolini - Aug 24, 2017

Scanning electron microscopes (SEM) scan the surface of the sample with an electron beam, collecting reflected electrons which carry information about the material the electrons interact with. If gas is in the sample chamber, its atoms interact with the beam, partly deflecting electrons and adding noise to the image. 

This is the reason why vacuum must be achieved in SEM before imaging. But while vacuum is crucial for proper analysis, it can also have a negative effect on certain types of materials. Read this blog to learn how you can neutralize vacuum and keep your samples intact.

Scanning electron microscopes (SEM) scan the surface of the sample with an electron beam, collecting reflected electrons which carry information about the material the electrons interact with. If gas is in the sample chamber, its atoms interact with the beam, partly deflecting electrons and adding noise to the image. 

This is the reason why vacuum must be achieved in SEM before imaging. But while vacuum is crucial for proper analysis, it can also have a negative effect on certain types of materials. Read this blog to learn how you can neutralize vacuum and keep your samples intact.

Read more

Expert sample preparation techniques for SEM

By Luigi Raspolini - Aug 17, 2017

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

Read more

SEM sample tilting: how to keep the area of interest within the field of view

By Luigi Raspolini - Aug 10, 2017

Certain samples are tricky to image. Sometimes, even the best sample preparation will be of no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

Certain samples are tricky to image. Sometimes, even the best sample preparation will be of no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

Read more

How next-generation composite materials are created and analysed

By Luigi Raspolini - Jul 6, 2017

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

Read more

Press Room | Privacy Policy | Disclaimer | Sitemap