Karl Kersten

Karl Kersten is head of the Application team at Thermo Fisher Scientific, the world leader in serving science. He is passionate about the Thermo Fisher Scientific product and likes converting customer requirements into product or feature specifications so customers can achieve their goals.

Backscattered electron images: how to improve their quality

By Karl Kersten - Sep 21, 2018

Backscatter electrons (BSEs) carry information on the material of the sample. Obtaining high-quality images with a backscattered electron detector depends on many factors, such as the conductivity of the sample, its morphology and composition, the type of BSE detector and the electronics. Given a fixed system with the same detector and electronics— and the same sample, we analyzed the factors that play a role in the quality of a BSE image. Beginning with the number of integrating frames and beam intensity, in this blog we will also discuss the roles of the working distance and the chamber pressure.

Backscatter electrons (BSEs) carry information on the material of the sample. Obtaining high-quality images with a backscattered electron detector depends on many factors, such as the conductivity of the sample, its morphology and composition, the type of BSE detector and the electronics. Given a fixed system with the same detector and electronics— and the same sample, we analyzed the factors that play a role in the quality of a BSE image. Beginning with the number of integrating frames and beam intensity, in this blog we will also discuss the roles of the working distance and the chamber pressure.

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STOP outsourcing your scanning electron microscopy research — get your own SEM!

By Karl Kersten - Sep 6, 2018

Are you a lab operator who wants to stop outsourcing your scanning electron microscopy jobs and buy your own Scanning Electron Microscope? Then you’ve probably already calculated that a personal SEM is a worthwhile capital investment. But the operational costs of SEM are just as important too: all the ongoing equipment expenses related to an SEM like the facilities, its maintenance, and operators.

Are you a lab operator who wants to stop outsourcing your scanning electron microscopy jobs and buy your own Scanning Electron Microscope? Then you’ve probably already calculated that a personal SEM is a worthwhile capital investment. But the operational costs of SEM are just as important too: all the ongoing equipment expenses related to an SEM like the facilities, its maintenance, and operators.

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Why SEM is the most suitable method for fiber analysis

By Karl Kersten - Aug 23, 2018

Fibers are all around us. Different types of fibers exist, but in most cases we do not notice them because they are used in a product. In case an object is much longer as it is wide we consider it a fiber. Fibers have specific properties for the product in which they are used. This blog will describe the different ways these fibers can be classified and how their performance can best be analysed. Hint: it has something to do with putting fibers under a specific type of microscope. You're about to discover the most suitable method for fiber analysis, so do read on!

Fibers are all around us. Different types of fibers exist, but in most cases we do not notice them because they are used in a product. In case an object is much longer as it is wide we consider it a fiber. Fibers have specific properties for the product in which they are used. This blog will describe the different ways these fibers can be classified and how their performance can best be analysed. Hint: it has something to do with putting fibers under a specific type of microscope. You're about to discover the most suitable method for fiber analysis, so do read on!

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Automated scanning electron microscopy (SEM) imaging: how it's used

By Karl Kersten - Aug 16, 2018

In a previous blog, we described how automating scanning electron microscopy (SEM) imaging saves researchers and operators valuable time. A lot of scanning electron microscope users use this for a wide range of purposes. This blog shows an example of how automated SEM imaging is used in the field: it details performing an automated Laser-Induced Damage Threshold test (LIDT).

In a previous blog, we described how automating scanning electron microscopy (SEM) imaging saves researchers and operators valuable time. A lot of scanning electron microscope users use this for a wide range of purposes. This blog shows an example of how automated SEM imaging is used in the field: it details performing an automated Laser-Induced Damage Threshold test (LIDT).

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Buying a scanning electron microscope: how to select the right SEM

By Karl Kersten - Aug 2, 2018

You want to buy a new scanning electron microscope (SEM) because you know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long.

You’ve made your case that your company could significantly improve their business performance and you could do your job better if SEM imaging and analysis were easier, faster and more accessible. Can a desktop SEM do what you need? This article provides the answers and helps you to select the right SEM.

You want to buy a new scanning electron microscope (SEM) because you know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long.

You’ve made your case that your company could significantly improve their business performance and you could do your job better if SEM imaging and analysis were easier, faster and more accessible. Can a desktop SEM do what you need? This article provides the answers and helps you to select the right SEM.

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Sample degradation during SEM analysis: what causes it and how to slow down the process

By Karl Kersten - Jul 19, 2018

When using a scanning electron microscope (SEM), the electron beam can, over time, permanently alter or degrade the sample that is being observed. Sample degradation is an unwanted effect as it can alter — or even destroy — the details you want to see, and consequently change your results and conclusions. In this blog, I will explain what can cause sample degradation, and how you can slow down the process.

When using a scanning electron microscope (SEM), the electron beam can, over time, permanently alter or degrade the sample that is being observed. Sample degradation is an unwanted effect as it can alter — or even destroy — the details you want to see, and consequently change your results and conclusions. In this blog, I will explain what can cause sample degradation, and how you can slow down the process.

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How a desktop SEM saves lab operators a lot of time

By Karl Kersten - Apr 6, 2018

Is it true that as a lab operator, you work under constant time pressure? Do you find it challenging to deliver output quickly? And does it take hard work to maintain your high standard of quality? This blogs explains how a desktop scanning electron microscope (SEM) can be used to increase your research productivity and therefore to save a lot of time.

Is it true that as a lab operator, you work under constant time pressure? Do you find it challenging to deliver output quickly? And does it take hard work to maintain your high standard of quality? This blogs explains how a desktop scanning electron microscope (SEM) can be used to increase your research productivity and therefore to save a lot of time.

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Desktop SEM electron sources: why CeB6 is the right choice

By Karl Kersten - Aug 3, 2017

If you’re looking for a scanning electron microscope (SEM), you probably know by now that the electron source is one of the most important parts of the system. In a previous blog, we talked about the properties of three different electron sources: the Tungsten, CeB6 and FEG sourcesIn this blog, we’ll take a closer look at Tungsten and CeB6 electron sources.

If you’re looking for a scanning electron microscope (SEM), you probably know by now that the electron source is one of the most important parts of the system. In a previous blog, we talked about the properties of three different electron sources: the Tungsten, CeB6 and FEG sourcesIn this blog, we’ll take a closer look at Tungsten and CeB6 electron sources.

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Is a desktop SEM the best choice for my application?

By Karl Kersten - Feb 9, 2017

You know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long. You’ve made your case that your company could significantly improve their business performance and you could do your job better if SEM imaging and analysis were easier, faster and more accessible. Can a desktop SEM do what you need?

You know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long. You’ve made your case that your company could significantly improve their business performance and you could do your job better if SEM imaging and analysis were easier, faster and more accessible. Can a desktop SEM do what you need?

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How this engineering company supercharged their R&D process

By Karl Kersten - Dec 9, 2016

As device dimensions are shrinking, researchers are required to work on nanoscale levels. As a result, new technology is needed to create and evaluate structures. Luckily in turn, the physical size of this technology is getting smaller too.

As device dimensions are shrinking, researchers are required to work on nanoscale levels. As a result, new technology is needed to create and evaluate structures. Luckily in turn, the physical size of this technology is getting smaller too.

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