Antonis Nanakoudis

Antonis Nanakoudis is Application Engineer at Phenom-World, the world’s leading supplier of desktop scanning electron microscopes. Antonis is extremely motivated by the capabilities of the Phenom SEM on various applications and is constantly looking to explore the opportunities that it offers for innovative characterization methods.

How EDX analysis with a scanning electron microscope (SEM) works

By Antonis Nanakoudis - Sep 7, 2017

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction — these can provide additional information about the sample. In this blog we will describe how energy — dispersive — X-ray (EDX or EDS) analysis works on a SEM.

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction — these can provide additional information about the sample. In this blog we will describe how energy — dispersive — X-ray (EDX or EDS) analysis works on a SEM.

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Topics: xray analysis, EDX

SEM: types of electrons, their detection and the information they provide

By Antonis Nanakoudis - Jun 29, 2017

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide. 

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide. 

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What is SEM? SEM technology explained

By Antonis Nanakoudis - Jun 1, 2017

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we describe the main working principles of a SEM instrument.

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we describe the main working principles of a SEM instrument.

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Why SEM is a valuable characterization technique for nanoparticles

By Antonis Nanakoudis - May 4, 2017

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

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