Antonis Nanakoudis

Antonis Nanakoudis is Application Engineer at Thermo Fisher Scientific, the world leader in serving science. Antonis is extremely motivated by the capabilities of the Phenom desktop SEM on various applications and is constantly looking to explore the opportunities that it offers for innovative characterization methods.

Sputter coating for SEM: how this sample preparation technique assists your imaging

By Antonis Nanakoudis - Aug 9, 2018

Scanning electron microscopes (SEMs) are very versatile tools that can provide information at the nanoscale of many different samples - with little or no sample preparation. In some cases though, sputter coating the samples prior to working with SEMs is recommended, or even necessary, in order to get a good SEM image. In this blog, we will explain how the sputter coating process works, and to which type of samples it should be applied.

Scanning electron microscopes (SEMs) are very versatile tools that can provide information at the nanoscale of many different samples - with little or no sample preparation. In some cases though, sputter coating the samples prior to working with SEMs is recommended, or even necessary, in order to get a good SEM image. In this blog, we will explain how the sputter coating process works, and to which type of samples it should be applied.

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EDX analysis with a scanning electron microscope (SEM): how does it work?

By Antonis Nanakoudis - Jun 21, 2018

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction, and these can provide additional information about the sample. In this blog we will describe how energy-dispersive X-ray (EDX or EDS) analysis works on a SEM.

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction, and these can provide additional information about the sample. In this blog we will describe how energy-dispersive X-ray (EDX or EDS) analysis works on a SEM.

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What is SEM? Scanning electron microscope technology explained

By Antonis Nanakoudis - Jun 7, 2018

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we explain what SEM is and describe the main working principles of a SEM instrument.

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we explain what SEM is and describe the main working principles of a SEM instrument.

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Additive manufacturing: improving the quality of AM processes through SEM analysis

By Antonis Nanakoudis - May 17, 2018

In a previous blog, we introduced Additive Manufacturing (AM) as a new manufacturing approach and described its key points (you can read the blog here). Additive Manufacturing, also known as 3D printing or rapid prototyping, has attracted the attention of many people and industries around the world due to its unlimited and promising potential. In this blog we will describe how the use of a Scanning Electron Microscope (SEM) can be a powerful tool to monitor and improve the quality of additive manufacturingprocesses.

In a previous blog, we introduced Additive Manufacturing (AM) as a new manufacturing approach and described its key points (you can read the blog here). Additive Manufacturing, also known as 3D printing or rapid prototyping, has attracted the attention of many people and industries around the world due to its unlimited and promising potential. In this blog we will describe how the use of a Scanning Electron Microscope (SEM) can be a powerful tool to monitor and improve the quality of additive manufacturingprocesses.

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What is additive manufacturing technology? How does the process work?

By Antonis Nanakoudis - Mar 22, 2018

Additive manufacturing is a relatively new manufacturing approach that has attracted the attention of many people and industries around the world due to its unlimited and promising potential. In this blog we will describe what Additive Manufacturing (AM) is and how it works and in a follow-up blog we will explain how SEM analysis can assist in improving the quality of the AM processes.

Additive manufacturing is a relatively new manufacturing approach that has attracted the attention of many people and industries around the world due to its unlimited and promising potential. In this blog we will describe what Additive Manufacturing (AM) is and how it works and in a follow-up blog we will explain how SEM analysis can assist in improving the quality of the AM processes.

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SEM and TEM: what's the difference?

By Antonis Nanakoudis - Feb 8, 2018

Electron microscopes have emerged as a powerful tool for the characterization of a wide range of materials. Their versatility and extremely high spatial resolution render them a very valuable tool for many applications. The two main types of electron microscopes are the Transmission Electron Microscope (TEM) and the Scanning Electron Microscope (SEM). In this blog we briefly describe their similarities and differences.

Electron microscopes have emerged as a powerful tool for the characterization of a wide range of materials. Their versatility and extremely high spatial resolution render them a very valuable tool for many applications. The two main types of electron microscopes are the Transmission Electron Microscope (TEM) and the Scanning Electron Microscope (SEM). In this blog we briefly describe their similarities and differences.

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Spot size in scanning electron microscopy (SEM): why it matters!

By Antonis Nanakoudis - Nov 9, 2017

Scanning electron microscopes have emerged as a very valuable characterization method in recent years, following the major technological developments and the continuous shrinking of material dimensions. SEMs are versatile tools that allow users to perform many different types of analyses on a wide range of materials and to achieve the best results, users should carefully select the main microscope settings. One of those settings is the spot size, i.e. the diameter of the probe at the sample. In this blog, I explain how to adjust the spot size in a SEM — and how to achieve the right balance between high-resolution imaging and a high beam current to get the results you’re looking for.

Scanning electron microscopes have emerged as a very valuable characterization method in recent years, following the major technological developments and the continuous shrinking of material dimensions. SEMs are versatile tools that allow users to perform many different types of analyses on a wide range of materials and to achieve the best results, users should carefully select the main microscope settings. One of those settings is the spot size, i.e. the diameter of the probe at the sample. In this blog, I explain how to adjust the spot size in a SEM — and how to achieve the right balance between high-resolution imaging and a high beam current to get the results you’re looking for.

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SEM: types of electrons, their detection and the information they provide

By Antonis Nanakoudis - Jun 29, 2017

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide.

Tip: Get a free demo of our Desktop SEM and discover it's capabilities for your research
Request your personal demo

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide.

Tip: Get a free demo of our Desktop SEM and discover it's capabilities for your research
Request your personal demo

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Why SEM is a valuable characterization technique for nanoparticles

By Antonis Nanakoudis - May 4, 2017

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

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