Antonis Nanakoudis

Antonis Nanakoudis is Application Engineer at Phenom-World, the world’s leading supplier of desktop scanning electron microscopes. Antonis is extremely motivated by the capabilities of the Phenom SEM on various applications and is constantly looking to explore the opportunities that it offers for innovative characterization methods.

Spot size in scanning electron microscopy (SEM): why it matters!

By Antonis Nanakoudis - Nov 9, 2017

Scanning electron microscopes have emerged as a very valuable characterization method in recent years, following the major technological developments and the continuous shrinking of material dimensions. SEMs are versatile tools that allow users to perform many different types of analyses on a wide range of materials and to achieve the best results, users should carefully select the main microscope settings. One of those settings is the spot size, i.e. the diameter of the probe at the sample. In this blog, I explain how to adjust the spot size in a SEM — and how to achieve the right balance between high-resolution imaging and a high beam current to get the results you’re looking for.

Scanning electron microscopes have emerged as a very valuable characterization method in recent years, following the major technological developments and the continuous shrinking of material dimensions. SEMs are versatile tools that allow users to perform many different types of analyses on a wide range of materials and to achieve the best results, users should carefully select the main microscope settings. One of those settings is the spot size, i.e. the diameter of the probe at the sample. In this blog, I explain how to adjust the spot size in a SEM — and how to achieve the right balance between high-resolution imaging and a high beam current to get the results you’re looking for.

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Topics: spot size

Sample preparation: how sputter coating assists your SEM imaging

By Antonis Nanakoudis - Sep 21, 2017

Scanning electron microscopes (SEMs) are very versatile tools that can provide information at the nanoscale of many different samples - with little or no sample preparation. In some cases though, combining SEMs with sputter coating is recommended, or even necessary, in order to get a good SEM image. In this blog, we will explain how sputter coating works, and to which type of samples it should be applied.

Scanning electron microscopes (SEMs) are very versatile tools that can provide information at the nanoscale of many different samples - with little or no sample preparation. In some cases though, combining SEMs with sputter coating is recommended, or even necessary, in order to get a good SEM image. In this blog, we will explain how sputter coating works, and to which type of samples it should be applied.

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How EDX analysis with a scanning electron microscope (SEM) works

By Antonis Nanakoudis - Sep 7, 2017

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction — these can provide additional information about the sample. In this blog we will describe how energy — dispersive — X-ray (EDX or EDS) analysis works on a SEM.

Scanning electron microscopes (SEMs) employ electron beams in order to get information from a sample at the nanoscale. The main type of signals that are detected are the backscattered (BSE) and secondary electrons (SE), which generate a grayscale image of the sample at very high magnifications. However, there are many other signals which can be a product of the electron-matter interaction — these can provide additional information about the sample. In this blog we will describe how energy — dispersive — X-ray (EDX or EDS) analysis works on a SEM.

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Topics: xray analysis, EDX

SEM: types of electrons, their detection and the information they provide

By Antonis Nanakoudis - Jun 29, 2017

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide. 

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide. 

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What is SEM? SEM technology explained

By Antonis Nanakoudis - Jun 1, 2017

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we describe the main working principles of a SEM instrument.

Scanning electron microscopy (SEM) has become a powerful and versatile tool for material characterization. This is especially so in recent years, due to the continuous shrinking of the dimension of materials used in various applications. In this blog, we describe the main working principles of a SEM instrument.

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Why SEM is a valuable characterization technique for nanoparticles

By Antonis Nanakoudis - May 4, 2017

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

The continuous increase of microscopic particles’ use in a huge range of applications has created the need of accurate control of their properties. I will explain why the use of precise monitoring and characterization of particles is required and how scanning electron microscopy can prove to be a valuable characterization method for you. Especially due to its versatility and superior spatial resolution.   

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