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Expert sample preparation techniques for SEM

By Wouter - Aug 17, 2017

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

When using a scanning electron microscope (SEM) for the first time, you might have doubts about what can be imaged. You might also struggle to get the image quality you were expecting. Luckily, you can easily improve your results by following the simple yet powerful sample preparation techniques for SEM in this blog. Read on! 

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SEM sample tilting: how to keep the area of interest within the field of view

By Wouter - Aug 10, 2017

Certain samples are tricky to image. Sometimes, even the best sample preparation will be of no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

Certain samples are tricky to image. Sometimes, even the best sample preparation will be of no help in finding the results you need. Surface roughness and features on top of the sample might hide the specific area of interest, which could contain crucial information about surface defects or characteristics of the imaged material. In cases like this, you need a new point of view. Read this blog to discover how you can get just that.

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Topics: SEM, tilting

Desktop SEM electron sources: why CeB6 is the right choice

By Karl Kersten - Aug 3, 2017

If you’re looking for a scanning electron microscope (SEM), you probably know by now that the electron source is one of the most important parts of the system. In a previous blog, we talked about the properties of three different electron sources: the Tungsten, CeB6 and FEG sourcesIn this blog, we’ll take a closer look at Tungsten and CeB6 electron sources.

If you’re looking for a scanning electron microscope (SEM), you probably know by now that the electron source is one of the most important parts of the system. In a previous blog, we talked about the properties of three different electron sources: the Tungsten, CeB6 and FEG sourcesIn this blog, we’ll take a closer look at Tungsten and CeB6 electron sources.

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How SEM revealed a solution to enhance hemp fibers for better properties

By Dr. Jasmin Zahn - Jul 26, 2017

Industrial hemp is one of the fastest growing plants and was one of the first plants used for the production of fibers about 10,000 years ago. Hemp fiber has been used extensively throughout history, with production climaxing soon after it was introduced to the New World. Read this blog to discover how hemp fibers can be used even more extensively because of better fiber properties, and how SEM helped reveal the solution that realizes these improvements. 

Industrial hemp is one of the fastest growing plants and was one of the first plants used for the production of fibers about 10,000 years ago. Hemp fiber has been used extensively throughout history, with production climaxing soon after it was introduced to the New World. Read this blog to discover how hemp fibers can be used even more extensively because of better fiber properties, and how SEM helped reveal the solution that realizes these improvements. 

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The power and potential of a programmable interface for desktop SEMs

By Ruud Bernsen - Jul 20, 2017

In previous blogs, I have written about automating large applications. But automation can also make the smaller tasks  quicker and easier for an operator. Behind every button on the menu, there is a command that is activated in code. The Phenom Programming Interface (PPI) gives you access to those commands, enabling you to write your own scripts. In this blog, I will cover a few simple examples of what you can do with PPI.

In previous blogs, I have written about automating large applications. But automation can also make the smaller tasks  quicker and easier for an operator. Behind every button on the menu, there is a command that is activated in code. The Phenom Programming Interface (PPI) gives you access to those commands, enabling you to write your own scripts. In this blog, I will cover a few simple examples of what you can do with PPI.

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How SEM helps understand the behavior of nanowire-based gas sensors

By Marijke Scotuzzi - Jul 13, 2017

Nanowires are widely used in electronic applications. They are typically used for transistors, where they bring benefits in terms of efficiency due to their high aspect ratio that enables good control of the channel potential. Nanowires are also being widely studied when used as sensors for proteins and chemicals. Researchers are exploring new and more efficient nanowire-based gas sensors by improving and developing new fabrication methods. In this blog, we discuss how microscopy helps to characterize nanowires and understanding their gas-sensing behavior. 

Nanowires are widely used in electronic applications. They are typically used for transistors, where they bring benefits in terms of efficiency due to their high aspect ratio that enables good control of the channel potential. Nanowires are also being widely studied when used as sensors for proteins and chemicals. Researchers are exploring new and more efficient nanowire-based gas sensors by improving and developing new fabrication methods. In this blog, we discuss how microscopy helps to characterize nanowires and understanding their gas-sensing behavior. 

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How next-generation composite materials are created and analysed

By Luigi Raspolini - Jul 6, 2017

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and their introduction into the industrial landscape.

In this article, I describe how these next-generation materials are being developed — and equally important: how their chemical composition is analysed, and their performance is measured.

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SEM: types of electrons, their detection and the information they provide

By Antonis Nanakoudis - Jun 29, 2017

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide. 

Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide. 

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Imaging fibers with a SEM: how to obtain a flawless quality analysis

By Marijke Scotuzzi - Jun 22, 2017

In our daily life, we make use of a large amount of objects and devices that are produced from fibers. Fibers are usually imaged in a scanning electron microscope (SEM), which provides high-resolution images, elemental analysis, and the possibility of automatically measuring thousands of fibers in mere minutes. But in some cases, imaging fibers with a SEM also presents challenges, as the nature of some fibers might compromise the quality of your analysis. With this in mind, this blog describes how you can obtain a high analysis quality through proper SEM configuration and sample preparation. 

In our daily life, we make use of a large amount of objects and devices that are produced from fibers. Fibers are usually imaged in a scanning electron microscope (SEM), which provides high-resolution images, elemental analysis, and the possibility of automatically measuring thousands of fibers in mere minutes. But in some cases, imaging fibers with a SEM also presents challenges, as the nature of some fibers might compromise the quality of your analysis. With this in mind, this blog describes how you can obtain a high analysis quality through proper SEM configuration and sample preparation. 

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How engineers and researchers can boost polymers properties with SEM

By Luigi Raspolini - Jun 16, 2017

Polymers have many uses and applications: engineered combinations of monomers produce a nearly infinite number of molecules with different properties, which are determined by the chemical composition and structure of the molecule. The form of the molecule has a big influence on how the polymer will behave when exposed to different external forces. In this blog, you’ll find practical examples of how Scanning Electron Microscopes (SEMs) can provide unexpected results.

Polymers have many uses and applications: engineered combinations of monomers produce a nearly infinite number of molecules with different properties, which are determined by the chemical composition and structure of the molecule. The form of the molecule has a big influence on how the polymer will behave when exposed to different external forces. In this blog, you’ll find practical examples of how Scanning Electron Microscopes (SEMs) can provide unexpected results.

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